Manufacturing, DFM & DFT — question 9 of 10
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You're designing test access for a densely populated board with no room for a full bed-of-nails fixture on 30% of nets, including several fine-pitch BGA power and signal pins. You have a budget for at most 8 dedicated test points and one boundary-scan-capable device already on the board. Describe the test strategy you'd propose, including what you'd verify with each method and what would still go untested.